The typical grazing-incidence XRD pattern collected for sample S1 shown in Fig. 3 (a) suggests a fully epitaxial film. The out-of-plane 2θ-ω scans for the three NiTiO 3 thin films prepared shown in Fig. 3 (b) indicate that all three films may exhibit the desired (001)-oriented perovskite structure with no evidence for secondary phase formation. The …